QureDA’s focus in business

Inspection tool for subsurface damage(SSD) detection

Wafer-to-wafer quality control using laser light scattering
“Surface quality”

Wafer-to-wafer quality control using laser light scattering
“Subsurface damage”

Wafer-to-wafer quality control using laser light scattering
“Warpage of wafer”

Cure of wafers with quality fluctuations by Dynamic AGE-ing🄬
“Principle”

Cure of wafers with quality fluctuations by Dynamic AGE-ing🄬
“Applications as an example”
