QureDA’s focus in business
Inspection tool for subsurface damage(SSD) detection
Wafer-to-wafer quality control using laser light scattering
“Surface quality”
Wafer-to-wafer quality control using laser light scattering
“Subsurface damage”
Wafer-to-wafer quality control using laser light scattering
“Warpage of wafer”
Cure of wafers with quality fluctuations by Dynamic AGE-ing🄬
“Principle”
Cure of wafers with quality fluctuations by Dynamic AGE-ing🄬
“Applications as an example”
